Instrument Introduction:

Multi functional design, flexible configuration, and multi angle measurement capability, making it easy to switch between online and offline configurations. It is a tool for simple, fast, and accurate characterization and analysis of single-layer and multi-layer thin films.

Technical parameters:

·Spectral range: 450-1000nm

·Multiple automatic selection of micro light spots

·Patent spot visualization technology, capable of observing any sample surface

·CCD detector

·Automatic sample table size: 200mmX200mm; XYZ direction

·Automatic adjustment; Z-axis height>35mm

Main features:

·One click operation, direct report output

·LCD modulation technology, measuring the absence of moving parts in the optical path

·CCD detection system, fast full spectrum output

·Multiple micro spot size options, patented visual technology

·Multi angle measurement

·Can achieve online measurement configuration